Phenom ParticleX AM
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Service & reparation Request a quoteThe Thermo Scientific Phenom ParticleX AM Desktop Scanning Electron Microscope (SEM) is a multi-purpose desktop SEM designed for additive manufacturing, delivering purity at the microscale.
Contact
Chris Bradburn
- Sales - Materials Analysis
- Phone: +46 (0)18-56 68 09
- Mobile: +46 (0)70-396 18 88
- chris.bradburn@gammadata.se

Technical specification
Phenom ParticleX |
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Light optical magnification | 3 – 16x |
Electron optical magnification range | 160 – 200,000x |
Resolution | < 10 nm |
Digital zoom | Max. 12x |
Light optical navigation camera | Color |
Acceleration voltages | Default: 5 kV, 10 kV and 15 kV Advanced mode: adjustable range between 4,8 kV and 20,5 kV imaging and analysis mode Secondary Electron Detector |
Vacuum modes | Standard mode Charge reduction mode High vacuum mode |
Detector | BSD EDS (optional) SED (optional) |
Sample size | Max. 100 mm x 100 mm Up to 36x 12mm pin stubs |
Sample height | Max. 65 mm
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