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Phenom ParticleX AM

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The Thermo Scientific Phenom ParticleX AM Desktop Scanning Electron Microscope (SEM) is a multi-purpose desktop SEM designed for additive manufacturing, delivering purity at the microscale.

The Thermo Scientific™ Phenom™ ParticleX Scanning Electron Microscope (SEM) for Additive Manufacturing, also known as the Phenom ParticleX AM Desktop SEM, is a versatile desktop SEM designed to provide microscale purity analysis. This instrument enables manufacturing companies to take in-house control of their data, particularly in the context of additive manufacturing processes.

Key Features:

  1. Critical Characteristics Monitoring: The Phenom ParticleX AM Desktop SEM allows the monitoring of critical characteristics of metal powders, making it well-suited for applications in powder-bed and powder-fed additive manufacturing processes.
  2. Analysis Capabilities: It facilitates the identification of particle size distributions, individual particle morphology, and foreign particles, providing valuable insights into the microstructure of materials.
  3. Large Sample Analysis: Equipped with a chamber that accommodates large samples up to 100 mm x 100 mm, allowing for a comprehensive analysis of a variety of samples.
  4. Venting/Loading Mechanism: The proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, enhancing throughput and operational efficiency.
  5. In-House Control of Data: The desktop SEM enables manufacturing companies to bring SEM analysis in-house, providing the benefits of in-house control, automation, chemical classification, and verification according to specific norms.
  6. Automated System: The system is automated and offers multiple sample analysis, making testing and classification up to 10 times faster, providing results within a shorter timeframe.
  7. Versatile Applications: In addition to additive manufacturing, the Phenom ParticleX Desktop SEM is designed for particle analysis of metal powders and confirmation that components fulfill technical cleanliness specifications according to standards such as VDA19 or ISO16232.

The Phenom ParticleX AM Desktop SEM not only delivers high-quality SEM analysis but is also designed to fulfill specific functions, making it a valuable tool for additive manufacturing and cleanliness analysis in various industries. Its in-house control, automation, and versatile applications contribute to its efficiency and effectiveness for microscale purity analysis.

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Chris Bradburn

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Technical specification

Phenom ParticleX AM
Light optical magnification 3 – 16x
Electron optical magnification range 160 – 200,000x
Resolution < 10 nm
Digital zoom Max. 12x
Light optical navigation camera Color
Acceleration voltages Default: 5 kV, 10 kV and 15 kV 
Advanced mode: adjustable range between 4,8 kV and 20,5 kV imaging and analysis mode Secondary Electron Detector
Vacuum modes Standard mode
Charge reduction mode
High vacuum mode
Detector BSD
EDS (optional)
SED (optional)
Sample size Max. 100 mm x 100 mm
Up to 36x 12mm pin stubs
Sample height Max. 65 mm

 

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