Phenom ParticleX Battery
Need help?
We help you find the right solution. We offer support, service, calibration and training for all our products. Contact us for a service agreement!
Service & reparation Request a quotePhenom ParticleX Battery Desktop SEM
Desktop scanning electron microscope for battery production and research.
Phenom Desktop SEM designed for battery materials analysis
In battery production and research, the quality of materials is becoming critical. Small contaminants in the NCM powder, for example, can have disastrous results in the final product. To trace these contaminants effectively, high-resolution SEM imaging with EDS analysis for chemistry is needed. When fully automated, this combination is a powerful tool for powder quality inspection. Phenom ParticleX Battery Desktop SEM key features
Conductance classifications
Each particle class can be labeled with a conductance of the particles, allowing you to sort on conductance of particles. This allows you to assess the impact of contamination much more accurately since a small organic contamination is not as severe as a metallic conductive contamination.
Ternary diagram
To view overall chemistry of the particle population, a ternary diagram can be generated where all particles are represented. With Ni, Co, and Mn on each axis, the outliers and general trends can be seen instantly
Data sheet
Contact
Chris Bradburn
- Sales - Materials Analysis
- Phone: +46 (0)18-56 68 09
- Mobile: +46 (0)70-396 18 88
- chris.bradburn@gammadata.se

Technical specification
Phenom ParticleX |
|
Light optical magnification | 3 – 16x |
Electron optical magnification range | 160 – 200,000x |
Resolution | < 10 nm |
Digital zoom | Max. 12x |
Light optical navigation camera | Color |
Acceleration voltages | Default: 5 kV, 10 kV and 15 kV Advanced mode: adjustable range between 4,8 kV and 20,5 kV imaging and analysis mode Secondary Electron Detector |
Vacuum modes | Standard mode Charge reduction mode High vacuum mode |
Detector | BSD EDS (optional) SED (optional) |
Sample size | Max. 100 mm x 100 mm Up to 36x 12mm pin stubs |
Sample height | Max. 65 mm
|