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Phenom ParticleX Battery

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Phenom ParticleX Battery Desktop SEM
Desktop scanning electron microscope for battery production and research.

Phenom Desktop SEM designed for battery materials analysis

In battery production and research, the quality of materials is becoming critical. Small contaminants in the NCM powder, for example, can have disastrous results in the final product. To trace these contaminants effectively, high-resolution SEM imaging with EDS analysis for chemistry is needed. When fully automated, this combination is a powerful tool for powder quality inspection. Phenom ParticleX Battery Desktop SEM key features

Conductance classifications

Each particle class can be labeled with a conductance of the particles, allowing you to sort on conductance of particles. This allows you to assess the impact of contamination much more accurately since a small organic contamination is not as severe as a metallic conductive contamination.

Ternary diagram

To view overall chemistry of the particle population, a ternary diagram can be generated where all particles are represented. With Ni, Co, and Mn on each axis, the outliers and general trends can be seen instantly

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Chris Bradburn

Chris

Technical specification

Phenom ParticleX 
Light optical magnification 3 – 16x
Electron optical magnification range 160 – 200,000x
Resolution < 10 nm
Digital zoom Max. 12x
Light optical navigation camera Color
Acceleration voltages Default: 5 kV, 10 kV and 15 kV 
Advanced mode: adjustable range between 4,8 kV and 20,5 kV imaging and analysis mode Secondary Electron Detector
Vacuum modes Standard mode
Charge reduction mode
High vacuum mode
Detector BSD
EDS (optional)
SED (optional)
Sample size Max. 100 mm x 100 mm
Up to 36x 12mm pin stubs
Sample height Max. 65 mm

 

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