Föregående
Se fler

Phenom ParticleX TC

Need help?

We help you find the right solution. We offer support, service, calibration and training for all our products. Contact us for a service agreement!

Service & reparation Request a quote

The Thermo Scientific™ Phenom™ ParticleX – Technical Cleanliness is designed to meet the growing demand for the analysis of smaller particles, particularly in industries such as automotive. This desktop scanning electron microscope (SEM) enables automated SEM with EDX spectrometry, providing a significant advantage over light microscopy. The inclusion of EDX spectrometry allows for chemical classification of particles, offering valuable insights into production processes and environments.

Key Features:

  1. Automated SEM with EDX Spectrometry: The Phenom ParticleX – Technical Cleanliness combines automated scanning electron microscopy with EDX spectrometry, allowing for the chemical classification of particles. This capability provides detailed information beyond what is achievable with light microscopy.
  2. Industry Standard 47 mm Filters: The instrument is capable of automatically analyzing industry standard 47 mm filters, making it suitable for various applications in technical cleanliness analysis.
  3. Customizable Parameters: Users can set specific parameters such as particle size range, chemical classification rules, area of interest, and stop criteria tailored to their application requirements.
  4. Report Generation: The Phenom ParticleX – Technical Cleanliness facilitates the creation of reports according to automotive industry standards, ensuring compliance and documentation.
  5. Versatile Applications: In addition to technical cleanliness analysis, the Phenom ParticleX is designed for particle analysis of metal powders at the microscale for the additive industry.
  6. In-House Analysis: The desktop SEM allows for in-house analysis, enabling companies to perform critical analyses on their desktops without the need for outsourcing.

The Phenom ParticleX – Technical Cleanliness is a versatile tool designed to provide high-quality SEM analysis while fulfilling specific functions related to technical cleanliness analysis and particle analysis in various industries. Its automated features, customizable parameters, and in-house capabilities make it a valuable asset for companies seeking detailed insights into the composition of particles in their production processes.

Contact

Chris Bradburn

Chris

Technical specification

Phenom ParticleX 
Light optical magnification 3 – 16x
Electron optical magnification range 160 – 200,000x
Resolution < 10 nm
Digital zoom Max. 12x
Light optical navigation camera Color
Acceleration voltages Default: 5 kV, 10 kV and 15 kV 
Advanced mode: adjustable range between 4,8 kV and 20,5 kV imaging and analysis mode Secondary Electron Detector
Vacuum modes Standard mode
Charge reduction mode
High vacuum mode
Detector BSD
EDS (optional)
SED (optional)
Sample size Max. 100 mm x 100 mm
Up to 36x 12mm pin stubs
Sample height Max. 65 mm

 

We use cookies on your website to give you the best experience. Read more here.