Phenom ParticleX TC
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Service & reparation Request a quoteThe Thermo Scientific™ Phenom™ ParticleX – Technical Cleanliness is designed to meet the growing demand for the analysis of smaller particles, particularly in industries such as automotive. This desktop scanning electron microscope (SEM) enables automated SEM with EDX spectrometry, providing a significant advantage over light microscopy. The inclusion of EDX spectrometry allows for chemical classification of particles, offering valuable insights into production processes and environments.
Key Features:
- Automated SEM with EDX Spectrometry: The Phenom ParticleX – Technical Cleanliness combines automated scanning electron microscopy with EDX spectrometry, allowing for the chemical classification of particles. This capability provides detailed information beyond what is achievable with light microscopy.
- Industry Standard 47 mm Filters: The instrument is capable of automatically analyzing industry standard 47 mm filters, making it suitable for various applications in technical cleanliness analysis.
- Customizable Parameters: Users can set specific parameters such as particle size range, chemical classification rules, area of interest, and stop criteria tailored to their application requirements.
- Report Generation: The Phenom ParticleX – Technical Cleanliness facilitates the creation of reports according to automotive industry standards, ensuring compliance and documentation.
- Versatile Applications: In addition to technical cleanliness analysis, the Phenom ParticleX is designed for particle analysis of metal powders at the microscale for the additive industry.
- In-House Analysis: The desktop SEM allows for in-house analysis, enabling companies to perform critical analyses on their desktops without the need for outsourcing.
The Phenom ParticleX – Technical Cleanliness is a versatile tool designed to provide high-quality SEM analysis while fulfilling specific functions related to technical cleanliness analysis and particle analysis in various industries. Its automated features, customizable parameters, and in-house capabilities make it a valuable asset for companies seeking detailed insights into the composition of particles in their production processes.
Contact
Chris Bradburn
- Sales - Materials Analysis
- Phone: +46 (0)18-56 68 09
- Mobile: +46 (0)70-396 18 88
- chris.bradburn@gammadata.se

Technical specification
Phenom ParticleX |
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Light optical magnification | 3 – 16x |
Electron optical magnification range | 160 – 200,000x |
Resolution | < 10 nm |
Digital zoom | Max. 12x |
Light optical navigation camera | Color |
Acceleration voltages | Default: 5 kV, 10 kV and 15 kV Advanced mode: adjustable range between 4,8 kV and 20,5 kV imaging and analysis mode Secondary Electron Detector |
Vacuum modes | Standard mode Charge reduction mode High vacuum mode |
Detector | BSD EDS (optional) SED (optional) |
Sample size | Max. 100 mm x 100 mm Up to 36x 12mm pin stubs |
Sample height | Max. 65 mm
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