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Phenom Pro G6

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The sixth-generation Thermo Scientific Phenom Pro G6 Desktop SEM represents a significant advancement in microscopy technology, bridging the gap between light microscopy and floor-model SEM analysis. This expansion of capabilities is particularly beneficial for research facilities, offering a fast, easy-to-use, and versatile solution for routine analysis.

Key Features:

  1. Ease of Use: The Phenom Pro G6 Desktop SEM is designed for fast and easy use, simplifying routine analysis for common samples. Users of any experience level can quickly adapt to its operation.

  2. Quick Imaging: Instrument configuration and the sample loading mechanism are optimized for quick imaging with minimal time spent tuning between experiments.

  3. High-Quality Results: Facility users can efficiently produce high-quality results with this desktop SEM, relieving the burden of routine analysis from floor-model SEM instruments.

  4. Long-Lifetime CeB6 Source: The instrument features a long-lifetime CeB6 source that offers high brightness while requiring low maintenance, contributing to its reliability.

  5. High Stability and Small Form Factor: The Phenom Pro G6 boasts high stability and a small form factor, allowing it to be used in practically any lab environment. It does not require specialized infrastructure or expert oversight.

The Thermo Scientific Phenom Pro G6 Desktop SEM is positioned as a versatile and accessible tool for research facilities, providing a seamless transition from light microscopy to advanced SEM analysis. Its user-friendly design, quick imaging capabilities, and reliability make it an efficient solution for various laboratory applications.


Chris Bradburn


Technical specification


Light optical magnification

  • 20-134x

Electron optical magnification range

  • 160-350,000x


  • ≤ 6 nm SED and ≤ 8 nm BSD

Digital zoom

  • Max. 12x

Light optical navigation camera

  • Color

Acceleration voltages

  • Default: 5 kV, 10 kV and 15 kV
  • Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging mode

Vacuum modes

  • High vacuum mode
  • Charge reduction mode via optional low vacuum sample holder


  • Backscattered electron detector (standard)
  • Energy dispersive X-ray spectroscopy detector (optional)
  • Secondary electron detector (optional)

Sample size

  • Up to 25 mm diameter
  • 32 mm (optional)

Sample height

  • Up to 35 mm
  • 100 mm (optional)

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