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Phenom ProX G6

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The Thermo Scientific Phenom ProX G6 Desktop SEM, representing the sixth generation, is a versatile desktop scanning electron microscope (SEM) with Energy-Dispersive X-ray Spectroscopy (EDS) capability. Designed to fill the gap between light microscopy and floor-model SEM analysis, this instrument expands the capabilities of research facilities, offering robust, effortless, and versatile elemental and SEM analysis.

Key Features:

  1. Fast, High-Resolution Imaging: The Phenom ProX G6 provides fast and high-resolution imaging, enabling detailed examination of samples.

  2. Integrated EDS Detector: The integrated Energy-Dispersive X-ray Spectroscopy (EDS) detector allows for robust, easy-to-use, and rapid elemental analysis directly within the SEM.

  3. Seamless Elemental Analysis: With EDS capability, the instrument facilitates elemental analysis, providing valuable information about the composition of the sample.

  4. Effortless Operation: The instrument is designed for ease of use, making it accessible for users with varying levels of experience.

  5. Versatile Application: Suitable for a wide range of applications in research facilities, the Phenom ProX G6 offers a seamless combination of imaging and elemental analysis.

This desktop SEM with EDS capability is positioned as a powerful tool for research facilities, enabling users to conduct comprehensive analyses with ease. The combination of high-resolution imaging and integrated EDS makes it an efficient and versatile solution for a variety of scientific applications.


Chris Bradburn


Technical specification

Light optical magnification
  • 20–134x
Electron optical magnification range
  • 160-350,000x
  • ≤ 6 nm SED and ≤ 8 nm BSD
Digital zoom
  • Max. 12x
Light optical navigation camera
  • Color
Acceleration voltages
  • Default: 5 kV, 10 kV and 15 kV
  • Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
Vacuum modes
  • High vacuum mode
  • Charge reduction mode via optional low vacuum sample holder
  • Backscattered electron detector (standard)
  • Energy-dispersive X-ray detector (standard)
  • Secondary electron detector (optional)
Sample size
  • Up to 25 mm diameter (optional 32 mm)
Sample height
  • Up to 35 mm (optional 100 mm)

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