Phenom ProX G6
Need help?
We help you find the right solution. We offer support, service, calibration and training for all our products. Contact us for a service agreement!
Service & reparation Request a quoteThe Thermo Scientific Phenom ProX G6 Desktop SEM, representing the sixth generation, is a versatile desktop scanning electron microscope (SEM) with Energy-Dispersive X-ray Spectroscopy (EDS) capability. Designed to fill the gap between light microscopy and floor-model SEM analysis, this instrument expands the capabilities of research facilities, offering robust, effortless, and versatile elemental and SEM analysis.
Key Features:
-
Fast, High-Resolution Imaging: The Phenom ProX G6 provides fast and high-resolution imaging, enabling detailed examination of samples.
-
Integrated EDS Detector: The integrated Energy-Dispersive X-ray Spectroscopy (EDS) detector allows for robust, easy-to-use, and rapid elemental analysis directly within the SEM.
-
Seamless Elemental Analysis: With EDS capability, the instrument facilitates elemental analysis, providing valuable information about the composition of the sample.
-
Effortless Operation: The instrument is designed for ease of use, making it accessible for users with varying levels of experience.
-
Versatile Application: Suitable for a wide range of applications in research facilities, the Phenom ProX G6 offers a seamless combination of imaging and elemental analysis.
This desktop SEM with EDS capability is positioned as a powerful tool for research facilities, enabling users to conduct comprehensive analyses with ease. The combination of high-resolution imaging and integrated EDS makes it an efficient and versatile solution for a variety of scientific applications.
Contact
Chris Bradburn
- Sales - Materials Analysis
- Phone: +46 (0)18-56 68 09
- Mobile: +46 (0)70-396 18 88
- chris.bradburn@gammadata.se
Technical specification
Specifications
Light optical magnification |
|
Electron optical magnification range |
|
Resolution |
|
Digital zoom |
|
Light optical navigation camera |
|
Acceleration voltages |
|
Vacuum modes |
|
Detector |
|
Sample size |
|
Sample height |
|