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Phenom XL G2

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The next-generation Thermo Scientific Phenom XL G2 Desktop Scanning Electron Microscope (SEM) represents a cutting-edge solution that automates the quality control process, providing accurate and reproducible results while saving time for value-added work. This innovative instrument is designed to meet quality standards through an intuitive and automated approach that eliminates manual, repetitive tasks.

Key Features:

  1. Automated Quality Control: The Phenom XL G2 automates the quality control process, enabling the acquisition of accurate and reproducible results. This automation is instrumental in discovering failures early and adjusting production processes rapidly when needed.
  2. Elimination of Manual Tasks: By automating quality control, the instrument reduces the need for manual, repetitive tasks, minimizing the chances of human error and increasing efficiency.
  3. Quick Learning Curve: The all-new, easy-to-learn interface facilitates a quick learning curve for users, making it ideal for a wide range of applications.
  4. Full-Screen Images: The Phenom XL G2 features full-screen images, providing a detailed view of the samples, and it achieves an average time-to-image of 60 seconds for swift analysis.
  5. CeB6 Electron Source: Equipped with a unique CeB6 electron source that offers a long lifetime with less maintenance, contributing to the instrument’s reliability.
  6. Small Form Factor: The small form factor requires little lab space, allowing flexibility in placing the microscope exactly where it is needed.

The Thermo Scientific Phenom XL G2 Desktop SEM is a state-of-the-art solution that combines automation, efficiency, and reliability in the quality control process. With its quick learning curve, full-screen imaging capabilities, and compact design, it stands as a valuable tool for a variety of applications in research and industry.


Chris Bradburn


Technical specification

Electron optical
  • Long lifetime thermionic source (CeB6 )
  • Multiple beam currents
Electron optical magnification range
  • 160 – 200,000x
Light optical magnification
  • 3–16x
  • <10 nm
Image resolution options
  • 960 x 600, 1920 x 1200, 3840 x 2400 and 7680 x 4800 pixels
Acceleration voltages
  • Default: 5 kV, 10 kV and 15 kV
  • Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
Vacuum levels
  • Low – medium – high
  • Backscattered electron detector (standard)
  • Secondary electron detector (optional)
  • Energy-dispersive X-ray spectroscopy (EDS) detector (optional)
Sample size
  • Max. 100 mm x 100 mm (up to 36 x 12 mm pin stubs)
  • Max. 40 mm (h)
Sample loading time
  • Light optical <5 s
  • Electron optical <60 s

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