The 3D Roughness Reconstruction application for Phenom desktop SEM systems enables the generation of three-dimensional images and submicrometer roughness measurements. This application provides valuable insights into sample characteristics by offering 3D imaging capabilities, making images more understandable for a wider range of users.
Key Specifications:
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Intuitive User Interface, Maximum Employability: The 3D Roughness Reconstruction application features an intuitive and fully automated user interface, ensuring maximum employability. Users can easily navigate and utilize the application without the need for extensive training.
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Shape from Shading Technology: The application is based on “shape from shading” technology, eliminating the requirement for stage tilt. This technology contributes to the efficient and accurate reconstruction of three-dimensional images.
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Fast Reconstruction: The 3D Roughness Reconstruction application offers fast reconstruction of three-dimensional images, providing users with quick and reliable results. The speed of reconstruction enhances the overall efficiency of the imaging process.
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Enhanced Resolution with SEM Imaging: By utilizing SEM imaging for data collection, the application achieves much better resolution compared to traditional (indirect) methods. This enhanced resolution is crucial for accurate measurements of average roughness (Ra) and roughness height (Rz).
Understanding and controlling production processes often require precise measurements of surface roughness. The 3D Roughness Reconstruction application, coupled with Phenom desktop SEM systems, addresses this need by providing a user-friendly interface, efficient reconstruction, and enhanced resolution for submicrometer roughness measurements.