Phenom ParticleX Steel
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The Phenom ParticleX Steel Desktop SEM is a combined SEM imaging and EDS analysis instrument for quality control in steel manufacturing, with industry-specific software designed to quickly and easily provide high-quality data for inclusion, fault, and failure analysis.
Designed for stability and atomic resolution imaging
- Versatility—SEM and EDS integrated into one instrument to meet all needs in a steel plant.
- Ease of use—New operators should be able to produce quality data with minimal training.
- Industry-specific software—Operation is further simplified, providing practical insight on common inclusions.
- High brightness—The CeB6 source enables characterization of sub-micrometer inclusions.
- Future-proof—Once you are comfortable with the tool, modify initial protocols to meet your specific analytical needs.
Tietolomake
Ota yhteyttä
Ramin Lindqvist
- Myynti - Materiaali Analyysi
- Matkapuhelin: +358 (0)400 570 760
- ramin.lindqvist@gammadata.fi
Tekniset tiedot
Phenom ParticleX |
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| Light optical magnification | 3 – 16x |
| Electron optical magnification range | 160 – 200,000x |
| Resolution | < 10 nm |
| Digital zoom | Max. 12x |
| Light optical navigation camera | Color |
| Acceleration voltages | Default: 5 kV, 10 kV and 15 kV Advanced mode: adjustable range between 4,8 kV and 20,5 kV imaging and analysis mode Secondary Electron Detector |
| Vacuum modes | Standard mode Charge reduction mode High vacuum mode |
| Detector | BSD EDS (optional) SED (optional) |
| Sample size | Max. 100 mm x 100 mm Up to 36x 12mm pin stubs |
| Sample height | Max. 65 mm
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