TFLFA – Thin film thermal conductivity
Tarvitsetko apua?
Autamme sinua löytämään oikean ratkaisun. Tarjoamme tukea, huoltoa, kalibrointia ja koulutusta kaikista tuotteistamme. Ota yhteyttä palvelusopimusta varten!
Huolto & Korjaukset Tarjouspyyntö
Thermophysical properties from thin-films are becoming more and more important in industries such as, phase-change optical disk media, thermo-electric materials, light emitting diodes (LEDs), phase change memories, flat panel displays, and the semiconductor industry. All these industries deposit a film on a substrate in order to give a device a particular function. Since the physical properties of these films differ from bulk material, these data are required for accurate thermal management predictions.
Based on the well established Laser Flash technique, the Linseis Laserflash for thin films (TFA) now offers a whole range of new possibilities to analyze thermophysical properties of thin films from 80nm up to 20 μm thickness. Two methods are now available:
- High Speed Laserflash Method (Rear heating Front detection (RF))
- Time Domain Thermoreflectance Method (Front heating Front detection (FF))
Ota yhteyttä
Chris Bradburn
- Myynti - Materiaalianalyysi
- Puhelin: +46 (0)18-56 68 09
- Matkapuhelin: +46 (0)70-396 18 88
- chris.bradburn@gammadata.se

Tekniset tiedot
Temperature range*: | RT |
RT up to 500°C | |
-100°C up to 500°C | |
Pump-Laser: | Nd:YAG Laser, maximum Impuls surrent: |
90mJ/Impuls (software controled), Pulswidth: 8 ns | |
Probe-Laser: | HeNe-Laser (632nm), 2mW |
Frontside-Thermoreflexion: | Si-PIN-Photodiode, active diameter: 0.8 mm, |
bandwidth DC … 400MHz, risetime: 1ns | |
Rearside-Thermoreflexion: | quadrant diode, active diameter: 1.1 mm |
bandwidth DC … 100MHz, risetime: 3.5ns | |
Measuring range: | 0,01 mm2/s up to 1000 mm2/s |
Sample diameter: | round samples ∅ 10…20 mm |
Sample thickness: | 80 nm up to 20 µm |
Number of samples: | Sample robot for up to 6 samples |
Atmospheres: | inert, oxidizing, reducing |
Vacuum: | up to 10E-4mbar |