HCS L36

The Linseis HCS systems are primarily utilized for the characterization of semiconductor materials. These systems can measure various important parameters including:

• Hall Constant: This is an important factor in determining the behavior of charge carriers in a material.
• Specific Resistance: The resistance of the material per unit length and cross-sectional area.
• Charge Carrier Concentration: The number of charge carriers per unit volume or area.
• Hall Mobilities: The mobility of charge carriers within the material.

Configuration and Temperature Options

The desktop base unit of the Linseis HCS systems can be configured with different sample holders to accommodate various sample geometries and temperature requirements. Additionally, optional extensions are available:

• Low-Temperature Extension: Allows the use of liquid nitrogen for measurements at lower temperatures.
• High-Temperature Version: Capable of handling temperatures up to 800°C.

Magnetic Field Capabilities

The systems are equipped with both permanent and electromagnets, providing fixed or variable magnetic fields up to nearly one Tesla.

Measuring Functions

The Linseis HCS systems offer a range of measuring functions, including:

• Charge Carrier Density: Applicable to layers [1/cm²] and solid materials [1/cm³].
• Hall Constant [cm³/C]
• Hall Mobility [cm²/Vs]
• Sheet Resistance [Ω]
• Specific Resistance [Ωcm]
• Electrical Conductivity [S/cm]
• Alpha: The ratio of horizontal to vertical resistance.
• Magnetoresistance
• Seebeck Coefficient [µV/K]

These features make the Linseis HCS systems versatile tools for analyzing semiconductor materials under various conditions.