Phenom ParticleX AM
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Service & reparation Request a quoteThe Thermo Scientific Phenom ParticleX AM Desktop Scanning Electron Microscope (SEM) is a multi-purpose desktop SEM designed for additive manufacturing, delivering purity at the microscale.
The Thermo Scientific™ Phenom™ ParticleX Scanning Electron Microscope (SEM) for Additive Manufacturing. The Phenom ParticleX AM Desktop SEM is a multi-purpose desktop SEM delivering purity at the microscale.
Take in-house control of your data:
- Monitor critical characteristics of metal powders
- Suited for powder-bed and powder-fed additive manufacturing processes
- Identify particle size distributions, individual particle morphology, and foreign particles
It is equipped with a chamber that allows the analysis of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput.
A growing number of manufacturing companies are establishing scanning electron microscopy (SEM) systems in-house. This trend, from outsourcing to in-house analysis, is growing and the benefits, such as the ability to perform a broad range of automated desktop analyses, chemical classification and verification according to specific norms are clear. The system is automated and offers multiple sample analysis, making testing and classification up to 10 times faster, giving certainty within one day.
The Phenom ParticleX Desktop SEM not only provides high quality SEM analysis, it is also designed to perform a number of specific functions. These include particle analysis of metal powders at the microscale for the additive industry, and confirming that components fulfill technical cleanliness specifications according to VDA19 or ISO16232 standards. All now made possible in-house and on your desktop.
Contact
Chris Bradburn
- Sales - Materials Analysis
- Phone: +46 (0)18-56 68 09
- Mobile: +46 (0)70-396 18 88
- chris.bradburn@gammadata.se

Technical specification
Phenom ParticleX |
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Light optical magnification | 3 – 16x |
Electron optical magnification range | 160 – 200,000x |
Resolution | < 10 nm |
Digital zoom | Max. 12x |
Light optical navigation camera | Color |
Acceleration voltages | Default: 5 kV, 10 kV and 15 kV Advanced mode: adjustable range between 4,8 kV and 20,5 kV imaging and analysis mode Secondary Electron Detector |
Vacuum modes | Standard mode Charge reduction mode High vacuum mode |
Detector | BSD EDS (optional) SED (optional) |
Sample size | Max. 100 mm x 100 mm Up to 36x 12mm pin stubs |
Sample height | Max. 65 mm
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