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Scanning Electron Microscopes

Phenom ProXG7

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Desktop SEM with EDS capability for robust, effortless, and versatile elemental and SEM analysis.

The 7th-generation of Thermo Scientific Phenom ProXG7 Desktop SEM fills the gap between light microscopy and floor-model SEM analysis, thus expanding the capabilities of research facilities. It offers fast, high-resolution imaging in addition to an integrated energy-dispersive X-ray diffraction (EDS) detector for robust, easy-to-use, rapid elemental analysis.

Data sheet

Phenom ProXG7 datasheet

Contact

Chris Bradburn

Sales - Materials Analysis
Phone: +46 (0)18-56 68 09
Mobile: +46 (0)70-396 18 88
chris.bradburn@gammadata.se

Technical specification

Specifications

Light optical magnification	27–160x
Electron optical magnification range	160-350,000x
Resolution	≤ 6 nm SED and ≤ 8 nm BSD
Digital zoom	Max. 12x
Light optical navigation camera	Color
Acceleration voltages	Default: 2 kV, 5 kV, 10 kV, 15 kV and 20 kV Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
Vacuum modes	High vacuum mode Charge reduction mode via optional low vacuum sample holder
Detector	Backscattered electron detector (standard) Energy-dispersive X-ray detector (standard) Secondary electron detector (optional)
Sample size	Up to 25 mm diameter (optional 32 mm)
Sample height	Up to 35 mm (optional 100 mm)